Particle characterization in technology
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CRC Press,Inc
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umblib-50272016-08-08 00:00:00Perpustakaan UMB YogyakartaParticle characterization in technologyBeddow,John KeithParticlesCRC Press,IncTEXT620.43/Bed/p/II/C.1ISBN:0-8493-5785-3 |
| institution |
Universitas Mercu Buana Yogyakarta |
| collection |
Perpustakaan Yogyakarta |
| topic |
Particles |
| spellingShingle |
Particles Beddow,John Keith Particle characterization in technology |
| description |
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| format |
TEXT |
| author |
Beddow,John Keith |
| author_facet |
Beddow,John Keith |
| author_sort |
Beddow,John Keith |
| title |
Particle characterization in technology |
| title_short |
Particle characterization in technology |
| title_full |
Particle characterization in technology |
| title_fullStr |
Particle characterization in technology |
| title_full_unstemmed |
Particle characterization in technology |
| title_sort |
particle characterization in technology |
| publisher |
CRC Press,Inc |
| publishDate |
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| callnumber-raw |
620.43/Bed/p/II/C.1 |
| callnumber-search |
620.43/Bed/p/II/C.1 |
| isbn |
ISBN:0-8493-5785-3 |
| _version_ |
1742489946036371456 |