Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985

xxi, 561 p.; 23 cm.

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Bibliographic Details
Main Author:	International Conference SIMS V
Language:	English
Published:	Springer-Verlag 1986
Subjects:	Kimia Analisis
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id	unylib-slims-18132
record_format	oai_dc
spelling	unylib-slims-181322014-04-10T16:14:19Z Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985 International Conference SIMS V Kimia Analisis Springer-Verlag 1986 en Buku Teks http://library.uny.ac.id/sirkulasi/index.php?p=show_detail&id=18132 3540162631 Berlin xxi, 561 p.; 23 cm.
institution	UNY
collection	Universitas Negeri Yogyakarta
language	English
topic	Kimia Analisis
spellingShingle	Kimia Analisis International Conference SIMS V Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985
description	xxi, 561 p.; 23 cm.
author	International Conference SIMS V
author_facet	International Conference SIMS V
author_sort	International Conference SIMS V
title	Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985
title_short	Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985
title_full	Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985
title_fullStr	Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985
title_full_unstemmed	Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985
title_sort	secondary ion mass spectrometry sims v : proceedings of the fifth international conference, washington dc, september 30 - octobre 4, 1985
publisher	Springer-Verlag
publishDate	1986
callnumber-raw	http://library.uny.ac.id/sirkulasi/index.php?p=show_detail&id=18132
callnumber-search	http://library.uny.ac.id/sirkulasi/index.php?p=show_detail&id=18132
_version_	1742311353619578880

Secondary ion mass spectrometry SIMS V : Proceedings of the fifth international conference, Washington DC, September 30 - Octobre 4, 1985

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